Keysight Technologies, Inc. and WIN Semiconductors Corp. have announced a strategic collaboration to simplify the design and verification of high-frequency RF components by introducing a unified MMIC (Monolithic Microwave Integrated Circuit) design workflow. The solution is designed to help GaN MMIC developers improve first-pass tapeout success while reducing costly design iterations.
The integrated workflow brings together on-chip multi-domain simulation, 3D layout verification, and off-chip MMIC evaluation board design within a single design environment. By connecting these traditionally separate stages, the solution aims to reduce design complexity and improve engineering efficiency for companies developing gallium nitride (GaN)-based MMICs for applications such as 5G infrastructure, Wi-Fi access points, satellite communications, and defense radar systems.
Tapeout failures often result in additional foundry respins, delaying product development and increasing costs. To address this challenge, the new workflow automates critical simulation, optimization, and verification processes before fabrication, helping engineers identify potential issues early in the design cycle and improve the likelihood of achieving a successful first tapeout.
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The workflow also extends beyond chip design by enabling engineers to optimize both on-chip and off-chip components, including packaging, printed circuit boards (PCBs), and test connectors as a complete system. This integrated approach allows design teams to validate overall performance using evaluation boards before production, providing customers with greater confidence in the final product.
As demand for high-frequency RF devices continues to grow across next-generation communications and defense applications, reducing design risk has become increasingly important for semiconductor companies. The collaboration also supports WIN Semiconductors’ latest NP 120P GaN Process Design Kit (PDK), which provides designers with process models and layout rules that integrate with Keysight Advanced Design System (ADS) and RF Circuit Simulation Professional software to automate key design and verification tasks.
Commenting on the collaboration, Richard Kuo, Director of Design Service, WIN Semiconductors, said: “We are delighted to collaborate with Keysight to deliver a customized LVS solution within the WIN ADS PDK. By combining Keysight’s ADS expertise with WIN’s robust PDK and advanced process technology, we provided a comprehensive verification solution that streamlined the customer’s design flow and accelerated the time-to-market for advanced RF products with greater confidence and reliability.”
Nilesh Kamdar, General Manager, EDA, Design Engineering Software, Keysight, highlighted the benefits of the integrated solution, stating: “WIN’s complete PDK, combined with Keysight’s simulation and verification tools, gives designers a single path from chip design through evaluation board. Design houses can now prove full system performance before fabrication, giving their customers the confidence to commit.”
The joint workflow is expected to help RF design houses accelerate product development, reduce engineering risk, and improve design confidence as demand for GaN-based RF technologies continues to expand across telecommunications, aerospace, satellite communications, and defense sectors.
