FormFactor, Inc., a leading provider of RF probe stations and probe cards, and Rohde & Schwarz, a global leader in test and measurement, have announced a strategic co-marketing partnership as part of FormFactor’s MeasureOne partner program, strengthening their capabilities in RF testing. This solution-integration initiative is designed to deliver validated, turnkey on-wafer RF testing systems. The collaboration combines advanced probing technology from FormFactor with industry-leading RF testing instrumentation from Rohde & Schwarz, providing manufacturers with comprehensive RF testing solutions spanning early design verification through production. With RF device complexity and operating frequencies continuing to increase, this expanded collaboration formalizes a tightly integrated on-wafer RF testing solution designed to lower integration effort and risk, reduce overall cost, and accelerate time-to-market for customers across development and production.
Reduced costs and faster time-to-market
On-wafer RF testing and device characterization of components such as 5G frontends and filters enable effective design validation during development, as well as product qualification and verification in production. By identifying faulty devices before packaging, manufacturers can significantly reduce costs and improve yield. Through their integrated RF testing solutions, Rohde & Schwarz and FormFactor help detect issues early in the process, accelerating time-to-market.
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Seamlessly integrated test solutions
Rohde & Schwarz and FormFactor have collaborated for several years to deliver powerful, seamlessly integrated RF testing solutions. Rohde & Schwarz offers instruments such as the R&S ZNA, a versatile high-end VNA capable of measuring key RF parameters and easily integrating with frequency converters to extend performance into the THz range. FormFactor complements this with a comprehensive portfolio of manual, semi-automated, and fully automated probe systems, featuring advanced thermal control, high-frequency probes, precision probe positioners, and robust calibration tools for enhanced RF testing accuracy.
This combined approach enables manufacturers to validate product performance directly during wafer runs, leveraging the expertise of both companies through integrated RF testing solutions. The tight integration of hardware and software components ensures fast, reliable RF testing. The complete solution includes advanced instruments, dependable wafer and die fixturing, and high-precision probe positioning throughout the entire test cycle, enhancing confidence in product quality and performance.
Jens Klattenhoff, SVP and GM of the Systems Business Unit at FormFactor, said: “By expanding our collaboration with Rohde & Schwarz through the MeasureOne program, we are delivering integrated on‑wafer RF test solutions designed to help customers reduce risk, improve efficiency, and accelerate development. This partnership brings together advanced wafer probing and proven RF measurement technologies to address the growing complexity of next‑generation semiconductor devices.”
Michael Fischlein, Vice President Spectrum & Network Analyzers, EMC and Antenna Test at Rohde & Schwarz, stated: “We are delighted to be part of MeasureOne, a strategic Co-Marketing partner program that unites FormFactor – one of the world’s leading probe station providers – with Rohde & Schwarz, a global leader in test and measurement. Together, we are set up to deliver turnkey on-wafer solutions enabling crucial and demanding test capabilities for next generation semiconductors.”
The MeasureOne partnership encompasses a wide range of Rohde & Schwarz instruments, including the R&S ZNA, R&S ZNB, R&S ZNBT, R&S ZVA and R&S ZNL VNA families, alongside signal and spectrum analyzers such as the FSW, FSWX , R&S FSV3000 and R&S FSVA3000. Integration also extends to signal generators (R&S SMA100B, R&S SMB100B, R&S SGS100A, R&S SGU100A) and selected frontends and converters for advanced calibration workflows, all working seamlessly with FormFactor’s traditional plus specialty probe stations for cryogenic and vacuum applications.
