Micross has announced the commercial launch of its Standard-Performance Nuclear Event Detector (NED), a next-generation radiation detection solution that delivers enhanced sensitivity, faster response times, and improved system efficiency. Designed to safeguard mission-critical electronics, the new NED supports demanding applications such as aircraft, unmanned aerial systems, defense weapons platforms, satellites, and military ground vehicles.
The Standard-Performance NED is manufactured by Micross in the United States and features a Micross-designed ASIC produced by Jazz Semiconductor Trusted Foundry, Inc. (JSTF), a U.S.-based trusted foundry and wholly owned subsidiary of Tower Semiconductor. As a U.S. Department of Defense DMEA Category 1B Trusted Supplier, JSTF supports the production of this device, which is offered as a standard commercial off-the-shelf (COTS) solution.
“Jazz Semiconductor Trusted Foundry is pleased to support the commercial launch of Micross’ critically important Standard-Performance NED,” said Scott Jordan, President of JSTF. “This program reflects our commitment to providing trusted ASIC manufacturing for advanced defense and aerospace technologies.”
A New Benchmark in Nuclear Event Detection
The Micross MYXRHNEDSCJ series establishes a new performance benchmark for nuclear event detection and system protection. The Standard-Performance NED is available now for evaluation in limited quantities. Full production of Extended Temperature Range (XT) and MIL-PRF-38534 Class H compliant versions are planned for later this year. Both versions of the new Standard-Performance NED deliver:
- 2× greater radiation dose-rate sensitivity
- SWaP Optimized, lowest power solution with integrated differential line drivers and receivers
- Response time reduced by more than 50% at 10X overdrive dose rate (3-5 ns with 20 to 50X overdrive)
Unlike legacy NED designs developed more than four decades ago, Micross’ Standard-Performance NED integrates differential line drivers and receivers directly on-chip. By eliminating the need for external drivers, this integrated approach reduces board space, minimizes shielding requirements, lowers system weight, and significantly decreases overall response latency, an issue that can double response times in traditional architectures.
Optimized for Fast, Reliable Protection
Advances in Micross’ internally designed PIN diode and IC architecture enable rapid prompt-dose radiation detection and industry-leading response times. These improvements help prevent damage to critical electronics while supporting continued system operation during nuclear events. The NED is engineered for seamless integration across a variety of subsystems, including power supplies, data communication networks, and more. Its SWaP Optimized architecture facilitates effortless connectivity, ensuring that it can easily adapt to different operational environments and requirements.
Key Features:
- Gamma Dose Rate Sensitivity Threshold: 1 × 10⁵ to 2 × 10⁷ rads (Si)/sec
- Radiation-Hardened Performance:
- Total Dose Survivability: 1 × 10⁶ rads (Si)
- Dose Rate Operate-Through: 2 × 10⁹ rads (Si)/sec
- Dose Rate Survivability: 1 × 10¹² rads (Si)/sec
- Neutron Fluence Operate-Through: 5 × 10¹³ neutrons/cm²
- Integrated Differential Drivers and Receivers for improved noise immunity and reduced SWaP
- Extended Operating Temperature: –55°C to +125°C
- Compact Package: 44-pin non-hermetic J-lead SMT package (0.650 in × 0.650 in × 0.113 in)
Performance Benefits:
- Faster detection and system response
- Improved noise immunity
- Reduced system size, weight, and power (SWaP)
- Enhanced reliability in extreme radiation environments
Micross also offers customization options to optimize response time, sensitivity, dynamic range, and form factor to meet specific mission requirements. The company’s applications engineering team supports customers throughout the design-in process.
“Micross’ next-generation NED delivers faster, more compact, and more reliable nuclear event detection,” said John Santini, Chief Technology Officer, Micross Components. “By applying modern design techniques to proven building blocks, this device significantly outperforms decades-old legacy solutions and provides greater protection for critical electronics.”
The Standard-Performance NED is available now for evaluation in limited quantities. Full production of XT and Class H versions compliant with MIL-PRF-38534 is planned for later this year.
