proteanTecs, a global leader in deep data analytics for electronics health and performance monitoring, has launched a groundbreaking solution for system production testing. By fusing embedded on-chip telemetry with a machine learning-driven analytics engine, the new platform unlocks previously inaccessible insights, transforming the way high-performance systems are tested, optimized, and deployed.
As systems across AI, cloud, telecommunications, and automotive industries become more complex, production challenges have intensified. From ensuring lifetime reliability to reducing test costs and accelerating time-to-market, system vendors face unprecedented demands.
proteanTecs’ new solution provides first-of-its-kind parametric visibility during functional testing, delivering real-time insights when software interacts with silicon. This enables detection of subtle, hidden failures, including power integrity issues, thermal anomalies, and assembly-related faults, while simultaneously improving performance and power efficiency at scale.
At the core of the platform is a hardware-embedded monitoring system, powered by on-chip Agents that collect deep telemetry throughout the production lifecycle. These insights feed into a cloud-based analytics engine enhanced with edge-deployed ML models, enabling actionable, inline decisions from new product introduction (NPI) through to high-volume manufacturing (HVM).
“Our embedded HW monitoring system serves as a sophisticated monitor for the system, capturing critical telemetry. Together with a dedicated software stack, system quality, power consumption, and performance are significantly improved,” said Evelyn Landman, proteanTecs co-founder and CTO. “We deliver the first-ever deep parametric visibility during PCB, Module, and System functional testing – under actual workloads and configurations.”
Beyond accelerating bring-up and debug cycles, the solution equips engineering teams with critical feedback to identify root causes and streamline readiness for volume production. During mass production, it supports population-level analytics, tracking behavioral trends and system health across large volumes, dramatically improving production quality and efficiency.
“Bridging the silicon-system gap, this telemetry reveals how the chip behaves within the system context, not just in isolation,” added Landman. “It provides a new layer of data – not derived, not inferred, but monitored directly from within the chip.”
“Today’s rapid adoption of complex AI, hyperscale computing is stretching traditional system production methods beyond their limits,” said Uzi Baruch, Chief Strategy Officer at proteanTecs. “We’re transforming test from a static, reactive process to a predictive, data-driven workflow that adapts to each device’s actual behavior. This empowers teams to move beyond oversimplified worst-case assumptions and into an era of precision performance tuning and quality assurance.”
Already in deployment with leading system vendors, the solution is proving its value by delivering measurable ROI and enabling a new standard for electronics production excellence.
