At the virtual RF Testing Innovations Forum 2026, experts from Rohde & Schwarz, Dassault Systèmes, FormFactor, and Focus Microwaves will share insights into current challenges in RF testing. The program will cover a range of topics, including residual measurements for active device characterization and techniques for validating absolute phase across different frequency ranges.
Accelerating time-to-market for aerospace and defense RF components
Markus Loerner, Market Segment Manager for RF and Microwave Components at Rohde & Schwarz, will open the conference with a keynote titled “The Commercialization of Specialized Aerospace and Defense Components.” His session will examine how rising demand in satellite communications and defense is driving the need for more advanced RF systems, and in turn, specialized components designed for these high-performance applications.
He will also compare key RF subsystems and outline the associated testing requirements, with a focus on simplifying development processes and accelerating time-to-market.
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The importance of clear phases and calibration
Many design engineers tend to underestimate the importance of accurate absolute phase measurements across a wide frequency range. One of the sessions will provide an overview of phase calibration techniques, including a closer look at comb generators and their traceability. It will also present practical applications through case studies, covering areas such as time-domain analysis, validation of frequency converters, and key considerations when working with vector network analyzers (VNAs).
Sub THz on-wafer testing methods and best practices
As multi-gigabit communication systems move toward higher frequency ranges, test engineers are required to push the limits of on-wafer S-parameter measurements to ensure accurate device modeling and characterization. A live demonstration at the FormFactor facility in Dresden will showcase best practices for achieving precise, stable, and repeatable D-band measurements in an on-wafer environment.
Using a R&S ZNA equipped with 170 GHz frequency extenders, the session will also highlight key measurement considerations and decision points that influence accuracy and reliability throughout the testing process.
Noise-parameter validation techniques
The online conference will conclude with a session focused on noise validation in RF circuits operating up to 67 GHz. As performance expectations for low-noise amplifiers (LNAs) continue to rise, driven by applications such as LEO satellite communications, remote sensing, and quantum computing, accurate and reliable noise measurements have become increasingly critical.
Since the LNA typically serves as the first stage in a receiver, its noise performance has a direct impact on overall system sensitivity and noise figure. This session will outline the fundamental principles of noise measurement and explain how noise parameters can be extracted using the cold-source method. Demonstrations will be carried out using the latest R&S ZNA, equipped with advanced noise-figure measurement capabilities.
The conference is free of charge, but registration is required. A full agenda, speaker biographies and the registration portal are available here: https://www.rohde-schwarz.com/rftif
